To further shrink electronic devices and to lower energy consumption, the semiconductor industry is interested in using 2D materials, but manufacturers need a quick and accurate method for detecting defects in these materials to determine if the material is suitable for device manufacture. Now a team of researchers representing Penn State, Northeastern University, Rice University, and Universidade Federal de Minas Gerais in Brazil has developed a technique to quickly and sensitively characterize defects in 2D materials.
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