This introductory webinar, on the history, state-of-the-art, and philosophy of nanometrology, will set the stage for the nanometrology webinar series.
The following topics will be discussed:
Introduction to the philosophy of nanometrology – how we decide what we measure and how we make decisions on the development of measurement methods; Cutting-edge technologies that enable nanoscale measurements; A case study of the history of challenges and advancements with nanoscale SEM.
Speakers:
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| Elisabeth Mansfield NIST |
Andras Vladar NIST |
Angela Hight-Walker NIST |
This webinar’s recording can be found here.
Metrology, the study of measurement, enables researchers to measure the properties and performance of materials and devices and to generate data from laboratory experiments. Over the past 20 years of nanotechnology R&D, many areas of research have required the development of tools, methods, and techniques to characterize and evaluate materials, devices, and formulations. Nanometrology, the study of nanoscale measurement, presents a unique set of challenges due to the small size of the materials, often requiring more sensitive and innovative tools, methods, and techniques to obtain and understand characterization data.
Previous webinars in the series can be found here.
