This webinar will address the types of measurement and analysis challenges in fields of nanotechnology that may be bottlenecked by computational challenges and large datasets.
- 4D-STEM, its big data challenges, and solutions;
- Development of the spatiotemporally-resolved digital twin tool;
- Development of the JARVIS (Joint Automated Repository for Various Integrated Simulations) database and its associated tools.
Speakers:
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| Colin Ophus Stanford University |
Subramanian Sankaranarayanan Center for Nanoscale Materials at Argonne National Laboratory |
Kamal Choudhary National Institute of Standards and Technology |
Webinar recording can be found here.
Metrology, the study of measurement, enables researchers to measure the properties and performance of materials and devices and to generate data from laboratory experiments. Over the past 20 years of nanotechnology R&D, many areas of research have required the development of tools, methods, and techniques to characterize and evaluate materials, devices, and formulations. Nanometrology, the study of nanoscale measurement, presents a unique set of challenges due to the small size of the materials, often requiring more sensitive and innovative tools, methods, and techniques to obtain and understand characterization data.
Previous webinars in the series can be found here.
