Method detects defects in 2D materials for electronics, sensors

Tuesday, January 28, 2020
(Funded by the National Science Foundation and the Air Force Office of Scientific Research)

To further shrink electronic devices and to lower energy consumption, the semiconductor industry is interested in using 2D materials, but manufacturers need a quick and accurate method for detecting defects in these materials to determine if the material is suitable for device manufacture. Now a team of researchers representing Penn State, Northeastern University, Rice University, and Universidade Federal de Minas Gerais in Brazil has developed a technique to quickly and sensitively characterize defects in 2D materials.